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Mayer, James W.
Print Edition
ZB
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Mayer, James W.
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ZB
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1
Book
Backscattering spectrometry /
Chu, Wei-Kan
1978
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2
Book
Electronic materials science : for integrated circuits in Si and GaAs /
Mayer, James W.
1990
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3
Book
Electronic thin film science : for electrical engineers and materials scientists /
Tu, King-Ning
1992
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4
Book
Fundamentals of nanoscale film analysis /
Alford, Terry L.
2007
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5
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Fundamentals of surface and thin film analysis /
Feldman, Leonard C.
1986
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6
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Handbook of modern ion beam materials analysis /
Tesmer, Joseph R.
1995
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7
Book
Ion beam handbook for material analysis /
Mayer, James W.
1977
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8
Book
Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation...
Mayer, James W.
1974
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9
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Ion implantation in semiconductors, silicon and germanium /
Mayer, James W.
1970
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10
Book
Laser annealing of semiconductors /
Poate, J. M.
1982
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11
Book
Materials analysis by ion channeling : submicron crystallography /
Feldman, Leonard C.
1982
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12
Book
Thin films : interdiffusion and reactions /
Poate, J. M.
1978
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Available as
Print Edition
Material Type
Book
12
Type of Literature
Handbook, Textbook
3
Conference Publication
1
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ZB
IBN-1-2
3
IEK-4
2
IBN-3-4
1
IEK-5
1
IFF
1
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IKP
1
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Name
Mayer, James W.
Feldman, Leonard C.
4
Poate, J. M.
2
Alford, Terry L.
1
Barbour, J. Charles
1
Chu, Wei-Kan
1
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Davies, John Arthur.
1
Eriksson, Lennart.
1
Lau, S. S.
1
Maggiore, Carl J.
1
Nastasi, Michael
1
Nicolet, Marc-A.
1
Picraux, S. T.
1
Rimini, E.
1
Tesmer, Joseph R.
1
Tu, K. N.
1
Tu, King-Ning
1
Ziegler, J. F.
1
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Subject
thin film
2
accelerator
1
activation analysis
1
backscattering
1
channeling
1
charged particle
1
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energy loss
1
epitaxy
1
gallium arsenide
1
instrumentation
1
interface phenomena
1
ion beam analysis
1
ion channeling
1
laser annealing
1
materials characterization
1
radiology
1
stress analysis
1
surface analysis
1
surface diffusion
1
surface electronic properties
1
surface energy
1
thin film physics
1
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Classification
FGGJ - Ion beam analysis, ion beam solid interaction
5
FFP - Physics of thin films
2
FHAB - Surface and thin film characterization
2
FAAB - Solid state physics - reference books
1
FGGB - Ion implantation, ion beam synthesis
1
FGJ - Laser and electron beam processing
1
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FGMH - Metallization, physics of microelectronics
1
FJLB - Physics of semiconductor devices
1
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Language
English
3
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