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Mayer, James W.
Print Edition
English
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Mayer, James W.
Print Edition
English
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1
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Backscattering spectrometry /
Chu, Wei-Kan
1978
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2
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Electronic thin film science : for electrical engineers and materials scientists /
Tu, King-Ning
1992
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3
Book
Fundamentals of nanoscale film analysis /
Alford, Terry L.
2007
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3
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ZB
3
IBN-1-2
1
IEK-4
1
Name
Mayer, James W.
Feldman, Leonard C.
2
Alford, Terry L.
1
Chu, Wei-Kan
1
Nicolet, Marc-A.
1
Tu, King-Ning
1
Subject
materials characterization
1
stress analysis
1
surface diffusion
1
surface electronic properties
1
surface energy
1
thin film
1
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thin film physics
1
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Classification
FFP - Physics of thin films
1
FGGJ - Ion beam analysis, ion beam solid interaction
1
FHAB - Surface and thin film characterization
1
Language
English
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