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Mayer, James W.
Feldman, Leonard C.
4
Poate, J. M.
2
Alford, Terry L.
1
Barbour, J. Charles
1
Chu, Wei-Kan
1
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Davies, John Arthur.
1
Eriksson, Lennart.
1
Lau, S. S.
1
Maggiore, Carl J.
1
Nastasi, Michael
1
Nicolet, Marc-A.
1
Picraux, S. T.
1
Rimini, E.
1
Tesmer, Joseph R.
1
Tu, K. N.
1
Tu, King-Ning
1
Ziegler, J. F.
1
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thin film
2
accelerator
1
activation analysis
1
backscattering
1
channeling
1
charged particle
1
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energy loss
1
epitaxy
1
gallium arsenide
1
instrumentation
1
interface phenomena
1
ion beam analysis
1
ion channeling
1
laser annealing
1
materials characterization
1
radiology
1
stress analysis
1
surface analysis
1
surface diffusion
1
surface electronic properties
1
surface energy
1
thin film physics
1
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FGGJ - Ion beam analysis, ion beam solid interaction
5
FFP - Physics of thin films
2
FHAB - Surface and thin film characterization
2
FAAB - Solid state physics - reference books
1
FGGB - Ion implantation, ion beam synthesis
1
FGJ - Laser and electron beam processing
1
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FGMH - Metallization, physics of microelectronics
1
FJLB - Physics of semiconductor devices
1
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