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Mayer, James W.
thin film
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Mayer, James W.
thin film
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1
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Fundamentals of nanoscale film analysis /
Alford, Terry L.
2007
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Handbook of modern ion beam materials analysis /
Tesmer, Joseph R.
1995
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2
IEK-4
1
Name
Mayer, James W.
Alford, Terry L.
1
Barbour, J. Charles
1
Feldman, Leonard C.
1
Maggiore, Carl J.
1
Nastasi, Michael
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Tesmer, Joseph R.
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Subject
thin film
accelerator
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activation analysis
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backscattering
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channeling
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charged particle
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energy loss
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instrumentation
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ion beam analysis
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materials characterization
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radiology
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FGGJ - Ion beam analysis, ion beam solid interaction
1
FHAB - Surface and thin film characterization
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