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Mayer, James W.
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Mayer, James W.
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1
Book
Backscattering spectrometry /
Chu, Wei-Kan
1978
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2
Book
Electronic materials science : for integrated circuits in Si and GaAs /
Mayer, James W.
1990
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3
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Electronic thin film science : for electrical engineers and materials scientists /
Tu, King-Ning
1992
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4
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"Fundamentals of nanoscale film analysis [E-Book] /
Alford, Terry L.
2007
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5
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Fundamentals of Nanoscale Film Analysis [E-Book] /
Alford, Terry L.
2007
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6
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Fundamentals of nanoscale film analysis /
Alford, Terry L.
2007
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7
Book
Fundamentals of surface and thin film analysis /
Feldman, Leonard C.
1986
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8
Book
Handbook of modern ion beam materials analysis /
Tesmer, Joseph R.
1995
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9
Book
Ion beam handbook for material analysis /
Mayer, James W.
1977
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10
Book
Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation...
Mayer, James W.
1974
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11
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Ion Implantation and Synthesis of Materials [E-Book] /
Nastasi, Michael.
2006
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12
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Ion implantation in semiconductors, silicon and germanium /
Mayer, James W.
1970
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13
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Laser annealing of semiconductors /
Poate, J. M.
1982
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14
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Materials analysis by ion channeling : submicron crystallography /
Feldman, Leonard C.
1982
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15
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New Uses of Ion Accelerators [E-Book] /
Cahill, Thomas A.
1975
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16
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Patterns of Light [E-Book] : Chasing the Spectrum from Aristotle to LEDs /
Beeson, Steven.
2008
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17
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Silver metallization [E-Book] : stability and reliability /
Adams, Daniel
2008
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18
Book
Thin films : interdiffusion and reactions /
Poate, J. M.
1978
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Available as
Print Edition
12
Electronic Edition
6
Material Type
Book
18
Type of Literature
Handbook, Textbook
3
Conference Publication
1
Year of Publication
From:
To:
Location
ZB
18
IBN-1-2
3
IEK-4
2
IBN-3-4
1
IEK-5
1
IFF
1
more ...
IKP
1
see all ...
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Name
Mayer, James W.
Feldman, Leonard C.
7
Alford, Terry L.
4
Chu, Wei-Kan
2
Poate, J. M.
2
Adams, Daniel
1
more ...
Barbour, J. Charles
1
Beeson, Steven.
1
Cahill, Thomas A.
1
Cairns, James A.
1
Crowder, Billy L.
1
Davies, John Arthur.
1
Dearnaley, Geoffrey
1
Eriksson, Lennart.
1
Kessel, Quentin
1
Lau, S. S.
1
Maggiore, Carl J.
1
Meyer, Otto
1
Nastasi, Michael
1
Nastasi, Michael.
1
Nicolet, Marc-A.
1
Picraux, S. T.
1
Picraux, Samuel T.
1
Rimini, E.
1
Smith, Winthrop W.
1
Tesmer, Joseph R.
1
Tu, K. N.
1
Tu, King-Ning
1
Wolicki, Eligius A.
1
Ziegler, J. F.
1
see all ...
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Subject
Physics
2
thin film
2
Atoms.
1
Chemistry, Physical organic
1
Condensed matter.
1
Electromagnetism
1
more ...
Materials
1
Materials science.
1
Microscopy.
1
Microwaves
1
Nanotechnology.
1
Optical materials
1
Particle acceleration
1
Physical optics
1
Physics.
1
Quantum optics
1
Solid state physics.
1
Spectroscopy.
1
Spectrum analysis
1
Surfaces (Physics)
1
Thin films.
1
accelerator
1
activation analysis
1
backscattering
1
channeling
1
charged particle
1
energy loss
1
epitaxy
1
gallium arsenide
1
instrumentation
1
see all ...
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Classification
FGGJ - Ion beam analysis, ion beam solid interaction
5
FFP - Physics of thin films
2
FHAB - Surface and thin film characterization
2
FAAB - Solid state physics - reference books
1
FGGB - Ion implantation, ion beam synthesis
1
FGJ - Laser and electron beam processing
1
more ...
FGMH - Metallization, physics of microelectronics
1
FJLB - Physics of semiconductor devices
1
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Language
English
6
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