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2 vartheta-Werte für die Röntgenspektralanalyse mit Ammonium-dihydrophosphat, (011), 2 d = 10,648 Angström als Analysatorkristall [E-Book] /

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2 vartheta-Werte für die Röntgenspektralanalyse mit Ammonium-dihydrophosphat, (011), 2 d = 10,648 Angström als Analysatorkristall [E-Book] /

Freiburg, Christoph
1968

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2 vartheta- Werte für die Röntgenspektralanalyse mit Gips, (020), 2 d = 15,185 Angström als Analysatorkristall [E-Book] /

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2 vartheta- Werte für die Röntgenspektralanalyse mit Gips, (020), 2 d = 15,185 Angström als Analysatorkristall [E-Book] /

Freiburg, Christoph
1968

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2 vartheta-Werte für die Röntgenspektralanalyse mit Lithiumfluorid, (200), 2 d = 4,0276 Angström als Analysatorkristall [E-Book] /

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2 vartheta-Werte für die Röntgenspektralanalyse mit Lithiumfluorid, (200), 2 d = 4,0276 Angström als Analysatorkristall [E-Book] /

Freiburg, Christoph
1968

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2 vartheta-Werte für die Röntgenspektralanalyse mit Lithiumfluorid, (220), 2 d = 2,848 Angström als Analysatorkristall [E-Book] /

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2 vartheta-Werte für die Röntgenspektralanalyse mit Lithiumfluorid, (220), 2 d = 2,848 Angström als Analysatorkristall [E-Book] /

Freiburg, Christoph
1968

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5

2 vartheta-Werte für die Röntgenspektralanalyse mit Pentaerythrit, (332), 2 d = 8,74 Angström als Analysatorkristall [E-Book] /

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2 vartheta-Werte für die Röntgenspektralanalyse mit Pentaerythrit, (332), 2 d = 8,74 Angström als Analysatorkristall [E-Book] /

Freiburg, Christoph
1968

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2 vartheta-Werte für die Röntgenspektralanalyse mit Quarz, (1011), 2 d = 6,6863 Angström als Analysatorkristall [E-Book] /

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2 vartheta-Werte für die Röntgenspektralanalyse mit Quarz, (1011), 2 d = 6,6863 Angström als Analysatorkristall [E-Book] /

Freiburg, Christoph
1968

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2 vartheta-Werte für die Röntgenspektralanalyse mit Topas, (303), 2 d = 2,712 Angström als Analysatorkristall [E-Book] /

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2 vartheta-Werte für die Röntgenspektralanalyse mit Topas, (303), 2 d = 2,712 Angström als Analysatorkristall [E-Book] /

Freiburg, Christoph
1968

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8

Advances in X-ray spectroscopy : contributions in honour of Professor Y. Cauchois /

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Advances in X-ray spectroscopy : contributions in honour of Professor Y. Cauchois /

Cauchois, Y.
1982

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9

Annual conference on application of X-ray analysis. 10. Proceedings : Denver, CO, 07.08.61-09.08.61 /

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Annual conference on application of X-ray analysis. 10. Proceedings : Denver, CO, 07.08.61-09.08.61 /

Mueller, W. M.
1962

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10

Annual conference on application of X-ray analysis. 11. Proceedings : Denver, CO, 08.08.62-10.08.62 /

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Annual conference on application of X-ray analysis. 11. Proceedings : Denver, CO, 08.08.62-10.08.62 /

Mueller, W. M.
1963

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11

Annual conference on application of X-ray analysis. 9. Proceedings : Denver, CO, 10.08.60-12.08.60 /

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Annual conference on application of X-ray analysis. 9. Proceedings : Denver, CO, 10.08.60-12.08.60 /

Mueller, W. M.
1961

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12

Annual conference on applications of X-ray analysis. 7. Proceedings : 13.08.58-15.08.58 /

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Annual conference on applications of X-ray analysis. 7. Proceedings : 13.08.58-15.08.58 /

Mueller, W. M.
1960

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13

Annual conference on applications of X-ray analysis. 41. Proceedings : Colorado-Springs, CO, 03.08.96-07.08.96 /

Book

Annual conference on applications of X-ray analysis. 41. Proceedings : Colorado-Springs, CO, 03.08.96-07.08.96 /

Gilfrich, John V.
1995

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14

Annual conference on applications of X-ray analysis. 27. Proceedings : Denver, CO, 01.08.78-04.08.78 /

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Annual conference on applications of X-ray analysis. 27. Proceedings : Denver, CO, 01.08.78-04.08.78 /

MacCarthy, G. J.
1979

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15

Annual conference on applications of X-ray analysis. 21. Proceedings : Denver, CO, 02.08.72-04.08.72 /

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Annual conference on applications of X-ray analysis. 21. Proceedings : Denver, CO, 02.08.72-04.08.72 /

Birks, L. S.
1973

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16

Annual conference on applications of X-ray analysis. 42. Proceedings : Denver, CO, 02.08.93-06.08.93 /

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Annual conference on applications of X-ray analysis. 42. Proceedings : Denver, CO, 02.08.93-06.08.93 /

Gilfrich, John V.
1995

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17

Annual conference on applications of X-ray analysis. 26. Proceedings : Denver, CO, 03.08.77-05.08.77 /

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Annual conference on applications of X-ray analysis. 26. Proceedings : Denver, CO, 03.08.77-05.08.77 /

Barrett, C. S.
1978

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18

Annual conference on applications of X-ray analysis. 30. Proceedings : Denver, CO, 03.08.81-07.08.81 /

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Annual conference on applications of X-ray analysis. 30. Proceedings : Denver, CO, 03.08.81-07.08.81 /

Russ, John C.
1982

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19

Annual conference on applications of X-ray analysis. 36. Proceedings : Denver, CO, 03.08.87-07.08.87 /

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Annual conference on applications of X-ray analysis. 36. Proceedings : Denver, CO, 03.08.87-07.08.87 /

Barrett, C. S.
1988

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20

Annual conference on applications of X-ray analysis. 25. Proceedings : Denver, CO, 04.08.76-06.08.76 /

Book

Annual conference on applications of X-ray analysis. 25. Proceedings : Denver, CO, 04.08.76-06.08.76 /

MacMurdie, H. F.
1977

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Print Edition 101 Electronic Edition 13

Conference Publication 50 Handbook, Textbook 16 Report 8 Theses 5 Collection of Tables 2 Encyclopedia 1

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ZB 103 IEK-6 4 IKP 4 IEK-4 3 INM-5 2 IBN-3-4 1 more ... IEK-2 1 IFF 1 JCNS-4 1 TB 1 ZEA-1 1 see all ... less ...

Barrett, C. S. 12 Mueller, W. M. 8 Freiburg, Christoph 7 Reichert, Wolfgang 7 Fink, R. W. 4 Gilfrich, John V. 3 more ... Agarwal, Bipin K. 2 Birks, L. S. 2 Bokhoven, Jeroen A. van 2 Bonnelle, C. 2 Crasemann, B. 2 Geissler, Erik 2 Gould, R. W. 2 Hippert, Francoise 2 Hodeau, Jean Louis 2 Jenkins, R. 2 Lamberti, Carlo 2 Lelièvre-Berna, Eddy 2 Newkirk, J. B. 2 Regnard, Jean-René 2 Allison, Samuel K. 1 Ankerhold, Ulrike 1 Azaroff, Leonid V. 1 Barinskii, R. L. 1 Barr, Tery L. 1 Bertin, Eugene P. 1 Bertolini, G. 1 Block, C. B. 1 Blokhin, M. A. 1 Brame, Edward G. 1 see all ... less ...

X-ray analysis 40 X-ray spectroscopy 35 X-ray fluorescence analysis 13 X-ray diffraction analysis 11 X-ray diffraction 7 analyzer 7 more ... crystal 7 X-ray spectrometer 6 instrumentation 6 EXAFS (X-ray absorption fine structure) 5 X-ray absorption 5 diffraction 5 X-ray source 4 XANES (x-ray absorption near edge structure) 4 mechanical stress 4 semiconductor 4 x-ray 4 x-ray spectroscopy 4 Raman spectroscopy 3 X-ray fluorescence 3 X-ray scattering 3 X-ray spectrum 3 XAS (X-ray absorption spectroscopy) 3 XPS (X-ray photoelectron spectroscopy) 3 photoemission 3 photoionization 3 polymer 3 spectroscopy 3 strain 3 surface analysis 3 see all ... less ...

CUK - X-ray spectroscopy FCAB - X-ray crystallography, X-ray diffraction 13 CUKF - X-ray fluorescence analysis 8 PJE - Atomic collision processes 8 FHLB - Soft X-ray spectroscopy 6 FHCB - X-ray scattering 5 more ... FFGC - Electron spectroscopy 4 CUCD - Emission spectroscopy 3 CUO - Molecular spectroscopy 3 FHN - Neutron scattering 3 FHT - Gamma spectroscopy in solids 3 CTA - Chemical analysis - comprehensive works 2 CTD - Chemical analysis - general aspects 2 CTL - Thermal analysis 2 CUC - Atomic spectroscopy 2 CUR - Infrared spectroscopy 2 CUSE - Raman spectroscopy 2 CUW - Mass spectroscopy 2 FHA - Materials characterization - general aspects 2 FHJC - Microbeam analysis 2 FHL - Synchrotron radiation techniques 2 FJNC - Optical spectroscopy in solids 2 CAA - Chemistry - reference books 1 CTF - Chemical analytical methods 1 CTHD - Potentiometry 1 CTHH - Coulometry - voltammetry 1 CTS - Gas chromatography 1 CTT - Liquid chromatography 1 CTYM - Trace analysis 1 CUA - Spectroscopy 1 see all ... less ...

English 65 German 12

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