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FFPE - Thin film electronic properties, semiconductor interfaces
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FJEC - Amorphous semiconductors
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FFPE - Thin film electronic properties, semiconductor interfaces
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FJEC - Amorphous semiconductors
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1
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The Physics and technology of amorphous SiO2 /
Devine, Roderick A. B.
1988
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2
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Polycrystalline and amorphous thin films and devices /
Kazmerski, Lawrence L.
1980
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3
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Polycrystalline semiconductors : grain boundaries and interfaces : proceedings of the international symposium, Malente, Fed. Rep. of Germany, August 29 - September 2, 1988 /
Möller, Hans Joachim
1989
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Polycrystalline silicon for integrated circuit applications /
Kamins, Ted.
1988
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Polysilicon films and interfaces : Symposium on polysilicon films and interfaces: proceedings : Materials Research Society meeting. 1987 : Boston, MA, 01.12.87-03.12.87.
Wong, C. Y.
1988
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Polysilicon thin films and interfaces : Symposium on Polysilicon Films and Interfaces : 0002: papers : Spring meeting of the Materials Research Society : 1990: papers : San-Francis...
Kamins, T.
1990
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6
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6
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Conference Publication
4
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ZB
6
IEK-5
1
Name
Devine, Roderick A. B.
1
Kamins, T.
1
Kamins, Ted.
1
Kazmerski, Lawrence L.
1
Möller, Hans Joachim
1
Wong, C. Y.
1
Subject
silicon
2
amorphous film
1
electrical properties
1
integrated circuit
1
interface
1
polycrystalline
1
more ...
thin film
1
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Classification
FFPE - Thin film electronic properties, semiconductor interfaces
FJEC - Amorphous semiconductors
FAF - Materials research - comprehensive works
2
FJLB - Physics of semiconductor devices
1
FNS - Glass, vitreous ceramics
1
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