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FFPE - Thin film electronic properties, semiconductor interfaces
IBN-1-2
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FFPE - Thin film electronic properties, semiconductor interfaces
IBN-1-2
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1
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Low dimensional semiconductors : materials, physics technology, devices.
Kelly, M. J.
1995
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MOS (metal oxide semiconductor) physics and technology /
Nicollian, E. H.
2003
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Nanoelectronics and information technology : advanced electronic materials and novel devices /
Waser, Rainer
2003
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Semiconductor interfaces : formation and properties : International winter school on semiconductor interfaces : formation and properties: workshop, proceedings : Les-Houches, 24.02...
Lelay, G.
1987
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5
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The silicon / SiO2 system.
Balk, P.
1988
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5
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5
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2
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IBN-1-2
ZB
4
IEK-1
1
IEK-5
1
R-P
1
Name
Balk, P.
1
Brews, J. R.
1
Kelly, M. J.
1
Lelay, G.
1
Nicollian, E. H.
1
Waser, Rainer
1
Subject
semiconductor device
2
semiconductor physics
2
III - V semiconductor
1
MOS transistor
1
crystal growth
1
electron gas
1
more ...
heterojunction
1
low dimensional system
1
nanotechnology
1
semiconductor interface
1
semiconductor surface
1
transistor
1
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Classification
FFPE - Thin film electronic properties, semiconductor interfaces
FJLB - Physics of semiconductor devices
2
FFPG - Multilayer systems, quantum structures
1
FGN - Nanotechnology
1
TBF - Semiconductor devices
1
TBV - Electronic devices
1
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