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Adsorption and catalysis on transition metals and their oxides.
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Advanced characterization techniques for thin film solar cells. 2 /
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Advanced characterization techniques for thin film solar cells /
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Advanced characterization techniques for thin film solar cells. 1 /
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Annual meeting of the Materials Research Society. 1980, A/C: electronic materials : Boston, MA, 16.11.1980-21.11.1980.
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1980
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6
Atomic scale structure of interfaces : Symposium on atomic scale structure of interfaces: proceedings : Fall meeting of MRS. 1989 : Boston, MA, 27.11.89-29.11.89.
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Carrier mobility in advanced channel materials using alternative gate dielectrics /
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Characterization of epitaxial semiconductor films.
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9
Chemical control of the electrical surface properties of n-doped transition metal oxides /
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10
Chemistry and defects in semiconductor heterostructures : Symposium on chemistry and defects in semiconductor heterostructures : MRS spring meeting : San-Diego, CA, 24.04.89-27.04.89.
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Kawabe, M.
1989
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11
Chromium doped TiO2 sputtered thin films : synthesis, physical investigations and applications /
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12
Colloquium on Semiconductor Interfaces : Manchester, 07.04.87.
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1987
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13
Comparison of thin film transistor and soi technologies : Symposium : Materials Research Society: spring meeting. 0001 : Albuquerque, NM, 26.02.1984-28.02.1984.
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Lam, H. W.
1984
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14
Contacts to semiconductors : fundamentals and technology /
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15
Controlling the electrical properties of oxide heterointerfaces through their interface chemistry /
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Darstellung und Charakterisierung epitaktischer 3C-SiC Schichten auf Si(100) Substraten /
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17
Defect engineering of SrTiO3 thin films for resistive switching applications /
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Defect-interface interactions : symposium held November 29 - December 2, 1993, Boston, Massachusetts, USA : [Fall meeting MRS 1993]
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19
Dielectric films on gallium arsenide.
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Dielectric layers in semiconductors: novel technologies and devices : 1986: symposium : European Materials Research Society spring meeting : Strasbourg, 17.06.86-20.06.86.
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