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FGMH - Metallization, physics of microelectronics
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FGMH - Metallization, physics of microelectronics
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1
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Advanced metallization for future ULSI : symposium held April 8-11, 1996, San Francisco, California, USA : [Symposium on Advanced Metallization for Future ULSI] /
Tu, K. N.
1997
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2
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Electronic materials science : for integrated circuits in Si and GaAs /
Mayer, James W.
1990
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3
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Grundlagen der Elektrodiffusion zur Zuverlässigkeitsverbesserung von Al Leitbahnen für hochintegrierte Schaltungen /
Schreiber, H. U.
1985
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4
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Materials reliability in microelectronics. 8 : symposium held April 13-16, 1998, San Francisco, California, USA /
Bravman, John C.
1998
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5
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Materials reliability in microelectronics. 6 : symposium held April 8-12.1996, San Francisco, California, USA /
Filter, William F.
1997
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6
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Materials reliability in microelectronics. 7 : symposium held March 31-April 3, 1997, San Francisco, California, USA /
Clement, J. Joseph
1997
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7
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Materials reliability in microelectronics. 5 : symposium San-Francisco, CA, 17.04.95-21.04.95.
Oates, A. S.
1995
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Microelectronic materials.
Grovenor, C. R.
1989
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9
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Microstructural science for thin film metallisations in electronic applications : Microstructural science for thin film metallizations in electronic applications: topical symposium...
Sanchez, J.
1988
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10
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Reliability and degradation : Semiconductor devices and circuits.
Howes, M. J.
1981
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11
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Silicides for VLSI applications /
Murarka, Shyam P.
1983
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12
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Tungsten and other refractory metals for VLSI applications. 1 : Workshop on tungsten and other refractory metals for VLSI applications. 1985: proceedings : Workshop on tungsten and...
Blewer, R. S.
1986
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13
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VLSI metallization.
Einspruch, N. G.
1987
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Available as
Print Edition
Material Type
Book
13
Type of Literature
Conference Publication
7
Handbook, Textbook
1
Year of Publication
From:
To:
Location
IFF
ZB
7
IBN-1-2
1
Name
Blewer, R. S.
1
Bravman, John C.
1
Clement, J. Joseph
1
Einspruch, N. G.
1
Filter, William F.
1
Grovenor, C. R.
1
more ...
Howes, M. J.
1
Lau, S. S.
1
Mayer, James W.
1
Murarka, Shyam P.
1
Oates, A. S.
1
Sanchez, J.
1
Schreiber, H. U.
1
Tu, K. N.
1
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Subject
electromigration
4
microelectronics
4
reliability
4
mechanical stress
2
metallization
2
microstructure
2
more ...
ULSI (ultra large scale integration)
1
VLSI technology
1
construction
1
design
1
failure
1
gallium arsenide
1
integrated circuit
1
mechanical properties
1
modeling
1
packaging
1
simulation
1
thin film
1
tungsten
1
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Classification
FGMH - Metallization, physics of microelectronics
FGM - Microelectronic technology
1
FJLB - Physics of semiconductor devices
1
FMT - Refractory metals, refractory alloys
1
Language
German
1
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