1
Advanced metallization for future ULSI : symposium held April 8-11, 1996, San Francisco, California, USA : [Symposium on Advanced Metallization for Future ULSI] /
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2
Electronic materials science : for integrated circuits in Si and GaAs /
Book
3
Grundlagen der Elektrodiffusion zur Zuverlässigkeitsverbesserung von Al Leitbahnen für hochintegrierte Schaltungen /
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4
Materials reliability in microelectronics. 8 : symposium held April 13-16, 1998, San Francisco, California, USA /
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5
Materials reliability in microelectronics. 6 : symposium held April 8-12.1996, San Francisco, California, USA /
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6
Materials reliability in microelectronics. 7 : symposium held March 31-April 3, 1997, San Francisco, California, USA /
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7
Materials reliability in microelectronics. 5 : symposium San-Francisco, CA, 17.04.95-21.04.95.
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8
Microelectronic materials.
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9
Microstructural science for thin film metallisations in electronic applications : Microstructural science for thin film metallizations in electronic applications: topical symposium: proceedings : Annual meeting of the Minerals, Metals and Materials Society. 1988 : Phoenix, AZ, 26.01.88-27.01.88.
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10
Reliability and degradation : Semiconductor devices and circuits.
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11
Silicides for VLSI applications /
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12
Tungsten and other refractory metals for VLSI applications. 1 : Workshop on tungsten and other refractory metals for VLSI applications. 1985: proceedings : Workshop on tungsten and other refractory metals for VLSI applications. 1984: proceedings : Albuquerque, NM, 07.10.85-09.10.85 ; 12.11.84-13.11.84.
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13
VLSI metallization.
Book