Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Electronic Edition
FHEG - Tunneling microscopy, force microscopy
Celano, Umberto
Reset Filters
Show filters (3)
Electronic Edition
FHEG - Tunneling microscopy, force microscopy
Celano, Umberto
Ask a Librarian
Books & more
: Hits
1 - 1
of
1
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
E-Book
Electrical Atomic Force Microscopy for Nanoelectronics [E-Book] /
Celano, Umberto
2019
Full text
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Electronic Edition
Material Type
Book
1
Year of Publication
From:
To:
Location
ZB
1
Name
Celano, Umberto
Subject
Electronics.
1
Nanotechnology.
1
Optical materials.
1
Surfaces (Physics).
1
force microscopy
1
nanoelectronics
1
more ...
scanning probe microscopy
1
see all ...
less ...
Classification
FHEG - Tunneling microscopy, force microscopy
Language
English
1
×
Loading...