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FHEG - Tunneling microscopy, force microscopy
Ebert, Philipp
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Electronic Edition
FHEG - Tunneling microscopy, force microscopy
Ebert, Philipp
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E-Book
Quantitative Untersuchung von Defekten auf Oberflächen von III-V-Verbindungshalbleitern mit dem Rastertunnelmikroskop [E-Book] /
Ebert, Philipp
1993
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Electronic Edition
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ZB
1
Name
Ebert, Philipp
Subject
III - V semiconductor
1
scanning tunneling microscopy
1
surface defect
1
Classification
FFJ - Surface structure, gas solid interface
1
FHEG - Tunneling microscopy, force microscopy
FJHE - Defects and radiation effects in semiconductors
1
FJKC - III - V semiconductors
1
Language
German
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