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FHEG - Tunneling microscopy, force microscopy
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FGML - Characterization of electronic materials
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FHEG - Tunneling microscopy, force microscopy
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FGML - Characterization of electronic materials
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E-Book
Untersuchungen des Wachstums und der Struktur von Siliziden mittels Rastertunnelmikroskopie und Rastertunnelspektroskopie [E-Book] /
Raunau, Werner
1993
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Electronic Edition
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ZB
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Name
Raunau, Werner
1
Subject
epitaxy
1
scanning tunneling microscopy
1
silicide
1
Classification
FGML - Characterization of electronic materials
FHEG - Tunneling microscopy, force microscopy
FJKB - Elemental semiconductors
1
Language
German
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