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FHEG - Tunneling microscopy, force microscopy
Report
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FHEG - Tunneling microscopy, force microscopy
Report
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E-Book
Photoelektronische Messungen mit der Rastersondenmikroskopie zur Mikroanalyse reiner und modifizierter Halbleiteroberflächen im Elektrolyten [E-Book] /
Hiesgen, Renate
1999
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Electronic Edition
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ZB
1
Name
Hiesgen, Renate
1
Meissner, Dieter
1
Subject
scanning tunneling microscopy
1
semiconductor surface
1
surface analysis
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Classification
FHAB - Surface and thin film characterization
1
FHEG - Tunneling microscopy, force microscopy
Language
German
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