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Ebert, Philipp
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Theses
Ebert, Philipp
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Point defects in compound semiconductor surfaces [E-Book] /
Ebert, Philipp
2001
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Quantitative Untersuchung von Defekten auf Oberflächen von III-V-Verbindungshalbleitern mit dem Rastertunnelmikroskop [E-Book] /
Ebert, Philipp
1993
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Theses
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ZB
2
Name
Ebert, Philipp
Subject
scanning tunneling microscopy
2
III - V semiconductor
1
compound semiconductor
1
point defect
1
surface defect
1
Classification
FJHE - Defects and radiation effects in semiconductors
2
FDCB - Point defects
1
FFJ - Surface structure, gas solid interface
1
FHCF - Defect characterization
1
FHEG - Tunneling microscopy, force microscopy
1
FJKC - III - V semiconductors
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English
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German
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