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FFPE - Thin film electronic properties, semiconductor interfaces

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FFPE - Thin film electronic properties, semiconductor interfaces

ZB

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Abhängigkeit des Leckstromes und der Dielektrizitätskonstanten in SrTiO3- und (Ba,Sr)TiO3-Dünnschichtkondensatoren von der Kontaktmetallisierung [E-Book] /

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Abhängigkeit des Leckstromes und der Dielektrizitätskonstanten in SrTiO3- und (Ba,Sr)TiO3-Dünnschichtkondensatoren von der Kontaktmetallisierung [E-Book] /

Schmitz, Sam Isao
2002

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Allotaxie: ein neues Verfahren zur Herstellung von Eisendisilizid- und Siliziumdioxid-Heterostrukturen in Silizium [E-Book] /

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Allotaxie: ein neues Verfahren zur Herstellung von Eisendisilizid- und Siliziumdioxid-Heterostrukturen in Silizium [E-Book] /

Skeide, Ottmar
1994

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Banddiskontinuitäten an III-V Halbleitergrenzflächen : Verspannungsabhängigkeit und Einfluß von Zwischenschichten [E-Book] /

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Banddiskontinuitäten an III-V Halbleitergrenzflächen : Verspannungsabhängigkeit und Einfluß von Zwischenschichten [E-Book] /

Richard, Peter
1996

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Bandoffsets an Grenzflächen von hochverspannten III-V Halbleitern [E-Book] /

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Bandoffsets an Grenzflächen von hochverspannten III-V Halbleitern [E-Book] /

Ohler, Christian
1997

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Carrier mobility in advanced channel materials using alternative gate dielectrics /

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Carrier mobility in advanced channel materials using alternative gate dielectrics /

Özben, Eylem Durgun
2014

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Carrier mobility in advanced channel materials using alternative gate dielectrics [E-Book] /

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Carrier mobility in advanced channel materials using alternative gate dielectrics [E-Book] /

Özben, Eylem Durgun
2014

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Charakterisierung gestörter und nanokristalliner Halbleiterschichten mittels inelastischer Lichtstreuung [E-Book] /

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Charakterisierung gestörter und nanokristalliner Halbleiterschichten mittels inelastischer Lichtstreuung [E-Book] /

Berger, Michael G.
1992

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Chemical control of the electrical surface properties of n-doped transition metal oxides /

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Chemical control of the electrical surface properties of n-doped transition metal oxides /

Andrä, Michael Tobias
2019

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Chemical control of the electrical surface properties of n-doped transition metal oxides [E-Book] /

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Chemical control of the electrical surface properties of n-doped transition metal oxides [E-Book] /

Andrä, Michael Tobias
2019

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Controlling the electrical properties of oxide heterointerfaces through their interface chemistry [E-Book] /

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Controlling the electrical properties of oxide heterointerfaces through their interface chemistry [E-Book] /

Rose, Marc-André
2022

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Controlling the electrical properties of oxide heterointerfaces through their interface chemistry /

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Controlling the electrical properties of oxide heterointerfaces through their interface chemistry /

Rose, Marc-André
2022

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Darstellung und Charakterisierung epitaktischer 3C-SiC Schichten auf Si(100) Substraten /

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Darstellung und Charakterisierung epitaktischer 3C-SiC Schichten auf Si(100) Substraten /

Kunstmann, Thomas.
1996

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Defect engineering of SrTiO3 thin films for resistive switching applications /

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Defect engineering of SrTiO3 thin films for resistive switching applications /

Wicklein, Sebastian
2014

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Defect engineering of SrTiO3 thin films for resistive switching applications [E-Book] /

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Defect engineering of SrTiO3 thin films for resistive switching applications [E-Book] /

Wicklein, Sebastian
2014

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Direct measurement of anisotropic resistivity in thin films using a 4-probe STM /

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Direct measurement of anisotropic resistivity in thin films using a 4-probe STM /

Flatten, Tim
2020

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Direct measurement of anisotropic resistivity in thin films using a 4-probe STM [E-Book] /

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Direct measurement of anisotropic resistivity in thin films using a 4-probe STM [E-Book] /

Flatten, Tim
2020

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17

Einfluss von Grenzflächenrauhigkeit, Ordnungseffekten und Dotierungen auf die optischen Eigenschaften von INP- basierten MOCVD- Heterostrukturen.

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Einfluss von Grenzflächenrauhigkeit, Ordnungseffekten und Dotierungen auf die optischen Eigenschaften von INP- basierten MOCVD- Heterostrukturen.

Oertel, D.
1987

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Der Einfluß dünner Zwischenschichten auf die Bandkantendiskontinuität am Germanium/Galliumarsenid(110)- Halbleiterkontakt - eine photoemissionsspektroskopische Untersuchung [E-Book] /

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Der Einfluß dünner Zwischenschichten auf die Bandkantendiskontinuität am Germanium/Galliumarsenid(110)- Halbleiterkontakt - eine photoemissionsspektroskopische Untersuchung [E-Book...

Schäfer, Bernd-Josef
1990

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19

Einfluß von Stöchiometrie und Gd-Substitution die elektrischen und magnetischen Eigenschaften von Eu1-xGdxS-Aufdampfschichten b [E-Book] /

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Einfluß von Stöchiometrie und Gd-Substitution die elektrischen und magnetischen Eigenschaften von Eu1-xGdxS-Aufdampfschichten b [E-Book] /

Hackfort, H.
1978

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Elektronenspektroskopische Untersuchungen von Eisensilizid/Silizium-Heterostrukturen [E-Book] /

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Elektronenspektroskopische Untersuchungen von Eisensilizid/Silizium-Heterostrukturen [E-Book] /

Moritz, Heiko
1993

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Electronic Edition 44 Print Edition 28

Theses

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Andrä, Michael Tobias 2 Flatten, Tim 2 Freter, Lars 2 Hoppe, Michael 2 Merdzhanova, Tsvetelina 2 Reiners, Marcel 2 more ... Rose, Marc-André 2 Schumacher, Daniel 2 Schäfer, Anna Barbara 2 Schönauer, Kathrin Maria 2 Wang, Yuhan 2 Waschk, Markus 2 Weng, Robert 2 Wicklein, Sebastian 2 Zhang, Wendi 2 Özben, Eylem Durgun 2 Berger, Michael G. 1 Brunner, J. 1 Dudda, Christiane 1 Döpper, Joachim 1 Fitsilis, Fotios 1 Grebner, Stefan. 1 Grimm, Karsten 1 Hackfort, H. 1 Hartmann, Arno 1 Heinbach, Matthias Alexander. 1 Hierlemann, Matthias. 1 Kamp, Markus 1 Kohleick, Reinhard 1 Krause, Hans-Joachim 1 see all ... less ...

thin film 25 semiconductor heterostructure 18 oxide 12 silicon 8 electrical properties 7 heterostructure 7 more ... interface phenomena 7 scanning tunneling microscopy 7 III - V semiconductor 6 photoluminescence 6 chemical vapor deposition 5 spectroscopy 5 titanate 5 MOS device 4 dielectric material 4 magnetic properties 4 optoelectronics 4 semiconductor interface 4 silicon solar cell 4 strontium 4 transmission electron microscopy 4 defect 3 electron gas 3 electronic properties 3 epitaxy 3 molecular beam epitaxy 3 multilayer system 3 semiconductor 3 silicide 3 thin film technology 3 see all ... less ...

FFPE - Thin film electronic properties, semiconductor interfaces FGN - Nanotechnology 8 FGP - Nanoelectronics 6 FJKB - Elemental semiconductors 5 FJKC - III - V semiconductors 5 EISF - Thin film solar cells 4 more ... FFGC - Electron spectroscopy 4 FGK - Thin film technology, epitaxy 4 FGKC - Vacuum deposition, MBE 4 FHAB - Surface and thin film characterization 4 FNPB - Oxide ceramics, metal oxides, refractory material 4 FFPG - Multilayer systems, quantum structures 3 FJHB - Band structure and electronic transport in semiconductors 3 FFA - Surface science, surface physics - general aspects 2 FFG - Surface electronic effects 2 FFGH - Electron emission, field emission 2 FGGE - Ion beam surface modification 2 FGKF - Chemical vapor deposition 2 FJB - Electric materials 2 FJBC - Dielectric materials 2 FJC - Electronic properties of solids 2 FJL - Physics of solid state devices 2 FJLB - Physics of semiconductor devices 2 FJNC - Optical spectroscopy in solids 2 CAN - Chemistry - mathematical methods, computer applications 1 CUME - Picosecond phenomena 1 FANE - Computational solid state physics 1 FFME - Surface forces, adhesion, thin film mechanical properties 1 FHGB - Conventional electron microscopy 1 FHGE - Electron diffraction 1 see all ... less ...

English 37 German 23

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