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FHAB - Surface and thin film characterization
spectroscopy
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FHAB - Surface and thin film characterization
spectroscopy
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Chemical control of the electrical surface properties of n-doped transition metal oxides /
Andrä, Michael Tobias
2019
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Chemical control of the electrical surface properties of n-doped transition metal oxides [E-Book] /
Andrä, Michael Tobias
2019
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Spektroskopische Charakterisierung von Schichten und Schichtsystemen aus porösem Silicium im Hinblick auf optische und optoelektronische Anwendungen [E-Book] /
Thönissen, Markus
1999
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Available as
Electronic Edition
2
Print Edition
1
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Book
3
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Theses
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ZB
3
Name
Andrä, Michael Tobias
2
Thönissen, Markus
1
Subject
spectroscopy
electrical properties
2
materials science
2
monocrystal
2
oxide
2
semiconductor physics
2
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strontium
2
surface electronic properties
2
surface physics
2
surface properties
2
titanate
2
transition metal
2
crystal doping
1
electronic properties
1
optoelectronics
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porous silicon
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thin film
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Classification
FHAB - Surface and thin film characterization
FFA - Surface science, surface physics - general aspects
2
FFG - Surface electronic effects
2
FFPE - Thin film electronic properties, semiconductor interfaces
2
FJB - Electric materials
2
CUA - Spectroscopy
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FEJP - Porous media, capillarity
1
FJKB - Elemental semiconductors
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English
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German
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