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Blab, Marcus
2
Green, Matthew Felix Blishen
2
Kichin, Georgy
2
Korte, Stefan
2
Lüpke, Felix
2
Reichenberg, Bernd
2
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Röhrig, Serge
2
Schnedler, Michael
2
Weiss, Christian
2
Wirth, Ingo
2
Aldinger, Rolf
1
Anders, Michael
1
Bach, Claudia
1
Baier, Axel Sascha
1
Bayerbach, Markus.
1
Behler, Stefan.
1
Berthe, Rolf
1
Birkner, Alexander
1
Bott, Michael
1
Breuer, Norbert
1
Cox, Gerhard
1
Daniels, Claudia
1
Domke, Christiane
1
Ebert, Philipp
1
Emundts, Arndt
1
Flores-Pyttel, Thomas
1
Frohn, Josef
1
Göddenhenrich, Thomas
1
Hannemann, Heike
1
Heinrich, Marcus
1
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scanning tunneling microscopy
63
force microscopy
14
surface analysis
7
surface dynamics
5
charge transport
4
platinum
4
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surface
4
surface structure
4
thin film
4
titanate
4
III - V semiconductor
3
defect analysis
3
fullerenes
3
gold
3
low temperature
3
morphology
3
scanning electron microscopy
3
scanning probe microscopy
3
silicon
3
Raman spectroscopy
2
adsorption
2
barium
2
carbon
2
charge
2
copper
2
defect
2
diffusion
2
electric conductivity
2
gallium arsenide
2
graphene
2
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FHEG - Tunneling microscopy, force microscopy
FHAB - Surface and thin film characterization
12
FFJ - Surface structure, gas solid interface
7
FNX - Carbon, carbon materials
7
FHA - Materials characterization - general aspects
6
FHE - Imaging methods in materials characterization
6
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FFJB - Surface dynamics
5
FJKC - III - V semiconductors
4
FFJE - Molecular surface processes, gas surface interaction, adsorption
3
FHJ - Scanning electron microscopy, analytical electron microscopy
3
FJHE - Defects and radiation effects in semiconductors
3
CLJE - Catalyst characterization and surface phenomena
2
CLP - Colloid chemistry, surface chemistry
2
CUSE - Raman spectroscopy
2
FFA - Surface science, surface physics - general aspects
2
FGKC - Vacuum deposition, MBE
2
FJH - Semiconductor physics
2
FJKB - Elemental semiconductors
2
FLE - Superconductor materials
2
CNOP - Transport phenomena in electrolytes
1
CNRO - Electrode processes
1
FCD - Crystal physics
1
FDCH - Defects in metals
1
FEJH - Low dimensional materials, intercalation compounds
1
FFGC - Electron spectroscopy
1
FFGH - Electron emission, field emission
1
FFM - Liquid interfaces, adhesion
1
FGCB - Nucleation, crystallization phenomena
1
FGGJ - Ion beam analysis, ion beam solid interaction
1
FGK - Thin film technology, epitaxy
1
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