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Geck, Lotte
2
Althaus, Martin
1
Brodschelm, Andreas.
1
Cox, Gerhard
1
Dahlen, Achim
1
Domke, Christiane
1
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Freitag, Martin Karl
1
Froitzheim, H.
1
Gebhardt, Roman
1
Hausmann, Hubertus
1
Hollfelder, Martin
1
Holthenrich, Anke
1
Jäger, Nikos D.
1
Karagiannakos, Konstantinos
1
Kubon, Marcus
1
König, Frank
1
Lauter, Josef
1
Lentzen, Markus
1
Leuther, Arnulf
1
Loeken-Larsen, Hilde
1
Lohe, Christoph
1
Lorke, A. H.
1
Mörsch, Georg
1
Naeven, Ralf
1
Noack, Michael
1
Otte, Martin
1
Petersen, Stephan
1
Pillukat, Alexander
1
Reithmaier, J. P.
1
Richter, J.
1
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gallium arsenide
semiconductor
4
silicon
4
defect
3
molecular beam epitaxy
3
semiconductor heterostructure
3
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aluminum
2
computer modeling
2
cryogenics
2
crystal defect
2
crystal growth
2
defect analysis
2
dislocation
2
electronic properties
2
indium
2
integrated circuit
2
production
2
quantum computing, quantum computer
2
scanning tunneling microscopy
2
Auger effect
1
Bridgman method
1
Czochralski method
1
Gunn effect
1
III - V semiconductor
1
X-ray analysis
1
X-ray diffraction
1
anisotropy
1
arsenide
1
atomic beam scattering
1
band structure
1
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FJKC - III - V semiconductors
17
FJHE - Defects and radiation effects in semiconductors
6
FFPG - Multilayer systems, quantum structures
4
FGKC - Vacuum deposition, MBE
4
FFGC - Electron spectroscopy
3
FGCD - Crystal growth of specific substances
3
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FGK - Thin film technology, epitaxy
3
FJK - Specific semiconductor materials
3
DGF - Optical computing, computers - quantum computing, computers
2
FFPE - Thin film electronic properties, semiconductor interfaces
2
FGC - Crystal growth, crystal technology
2
FHCF - Defect characterization
2
FHEG - Tunneling microscopy, force microscopy
2
FJLB - Physics of semiconductor devices
2
CTDK - Chemical analysis of single elements
1
CUK - X-ray spectroscopy
1
FAE - Materials research - general interest
1
FCD - Crystal physics
1
FDM - Thermophysical properties of solids
1
FECH - Phase transitions in solids
1
FFGH - Electron emission, field emission
1
FFJB - Surface dynamics
1
FGKF - Chemical vapor deposition
1
FHCB - X-ray scattering
1
FHCD - Small angle scattering
1
FHJ - Scanning electron microscopy, analytical electron microscopy
1
FJC - Electronic properties of solids
1
FJCK - Electrical conduction in solid materials
1
FJHB - Band structure and electronic transport in semiconductors
1
FJKB - Elemental semiconductors
1
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