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Ab initio perspective on hydrogenated amorphous silicon for thin-film and heterojunction photovoltaics [E-Book] /

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Ab initio perspective on hydrogenated amorphous silicon for thin-film and heterojunction photovoltaics /
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Advanced materials for telecommunication. 1986 : [Symposium XIII "Advanced Materials for Telecommunication" at the European Materials Research Society Meeting, held in Strasbourg, 17-20 June 1986] /
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Advances in electronics and electron physics /
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Advances in photovoltaics . 1 /
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Advances in photovoltaics . 4 /
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Amorphous and microcrystalline semiconductors - science and technology. B : proceedings of the Eighteenth International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology : Snowbird, UT, USA, August 23-27, 1999 /
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Amorphous semiconductors - science and technology. 1 : proceedings of the Fifteenth International Conference on Amorphous Semiconductors - Science and Technology : Cambridge, England, September 6-10, 1993 /
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Amorphous semiconductors - science and technology. 2 : proceedings of the Fifteenth International Conference on Amorphous Semiconductors - Science and Technology : Cambridge, England, September 6-10, 1993 /
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Amorphous semiconductors - science and technology. 1 : proceedings of the Sixteenth International Conference on Amorphous Semiconductors - Science and Technology : Kobe, Japan, September 4-8, 1995 /
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Amplituden- und phasenaufgelöste Femtosekundenspektroskopie im mittleren Infrarot : Hochfeldtransport in Galliumarsenid und Silizium /
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Analytical chemistry of silicon /
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Assessment of changes in the electro-optical performance of Silicon Photomultiplier (SiPM) modules after irradiation with cold neutrons [E-Book] /

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Aufbau einer Molekularstrahlepitaxie-Anlage zur Herstellung von CoSi2/Si-Heterostrukturen und in Silizium vergrabener SiOx-Schichten sowie Charakterisierung dieser Schichtsysteme [E-Book] /

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Beiträge zur ionenstrahlgestützten Deposition von Silizium auf Kohlenstoff [E-Book] /

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Berechnung des Spaltprodukttransportes in SiC-beschichteten Brennelementen für Hochtemperaturreaktoren [E-Book] /

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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie [E-Book] /

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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /
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Beyond-CMOS technologies for next generation computer design /
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Bivalente Störstellen in Silizium, Germanium und Galliumarsenid.
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Roos, G.
1990
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