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Stolten, Detlef
Halbleiter-Nanoelektronik; PGI-9
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Stolten, Detlef
Halbleiter-Nanoelektronik; PGI-9
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Journal Article
XRD analysis of strain states in epitaxial YSZ/RE2O3 (RE=Y, Er) multilayers as a function of layer thickness
Keppner, Johannes
2015
Solid state ionics, 273 (2015) S. 2 - 7
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Strain States in YSZ / RE2O3 (RE = Er, Y, Gd) Multilayers as a Function of Layer Thickness and Their Effect on Interface Conductivity and Diffusion
Keppner, Johannes
2013
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Strain States in YSZ / RE2O3 (RE = Er, Y) Multilayers as a Function of Layer Thickness and Their Effect on Interface Conductivity and Diffusion
Keppner, J.
2013
MRS online proceedings library, 1542 (2013) S. mrss13-1542-g08-02
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Keppner, Johannes
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Korte, Carsten
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Schubert, Jürgen
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Stolten, Detlef
Zander, Willi
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Ziegner, Mirko
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Fuel Cells
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Solid Oxide Fuel Cell
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Controlling Electron Charge-Based Phenomena
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Halbleiter-Nanoelektronik; PGI-9
Technoökonomische Systemanalyse; IEK-3
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Werkstoffstruktur und -eigenschaften; IEK-2
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