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Stolten, Detlef
Controlling Electron Charge-Based Phenomena
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Stolten, Detlef
Controlling Electron Charge-Based Phenomena
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Journal Article
XRD analysis of strain states in epitaxial YSZ/RE2O3 (RE=Y, Er) multilayers as a function of layer thickness
Keppner, Johannes
2015
Solid state ionics, 273 (2015) S. 2 - 7
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Keppner, Johannes
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Korte, Carsten
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Schubert, Jürgen
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Stolten, Detlef
Zander, Willi
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Ziegner, Mirko
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Controlling Electron Charge-Based Phenomena
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Halbleiter-Nanoelektronik; PGI-9
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Technoökonomische Systemanalyse; IEK-3
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Werkstoffstruktur und -eigenschaften; IEK-2
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