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Halbleiter-Nanoelektronik; IBN-1
Bourdelle, K.K.
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Halbleiter-Nanoelektronik; IBN-1
Bourdelle, K.K.
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Conference Presentation
6
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5
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4
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1
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1
Contribution to a book
Electrical characterization of TbScO3/TiN gate stacks in MOS capacitors and MOSFETs on strained and unstrained SOI
Durgun Özben, E.
2010
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2
Conference Presentation
Formation and Characterization of Ultra-Thin Ni Silicides on Strained and Unstrained Silicon
Zhao, Q. T.
2010
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3
Conference Presentation
Ternary high-k oxides on SiGe and Ge substrates
Lopes, J. M. J.
2010
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4
Conference Presentation
MOSFETs with High Mobility Channel Materials and Higher-k/Metal Gate Stack
Yu, W.
2010
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5
Conference Presentation
High mobility Si-Ge channel and high-k materials for NanoMOSFETs
Zhao, Q. T.
2010
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6
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High mobility Si-Ge channels and novel high-k materials for NanoMOSFETs
Yu, W.
2010
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7
Conference Presentation
Highmobility Si/Si0.5Ge0.5/strained SOI p-MOSFET with HfO2/TiN Gate Stack
Zhang, B.
2010
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8
Contribution to a book
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Highmobility Si/Si0.5Ge0.5/strained SOI p-MOSFET with HfO2/TiN Gate Stack
Zhang, B.
2010
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9
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MOSFETs with High Mobility Channel Materials and Higher-k/Metal Gate Stack
Yu, W.
2010
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10
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Highmobility Si/Si0.5Ge0.5/strained SOI p-MOSFET with HfO2/TiN Gate Stack
Zhang, B.
2010
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11
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Highmobility Si-Ge channels and novel high-k materials for NanoMOSFETs
Yu, W.
2010
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12
Talk (non-conference)
From strained SOI layers to sSi NW: stress and electrical characterization
Minamisawa, R. A.
2010
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12
Document Type
Conference Presentation
6
Contribution to a book
5
Contribution to a conference proceedings
4
Talk (non-conference)
1
Name
Bourdelle, K.K.
Zhao, Q. T.
12
Mantl, S.
11
Buca, Dan Mihai
9
Hartmann, J.M.
9
Luptak, R.
9
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Yu, W.
9
Zhang, B.
9
Dürgün-Özben, Eylem
7
Schubert, Jürgen
7
Lopes, J. M. J.
5
Minamisawa, R. A.
5
Nichau, A.
4
Holländer, Bernhard
3
Kernevez, N.
3
Lenk, Steffi
3
Wang, X.
3
Feste, S. F.
2
Habicht, S.
2
Hagedorn, M.
2
Knoll, L.
2
Besmehn, A.
1
Grützmacher, Detlev
1
Schnee, M.
1
Urban, C.
1
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Research Program
Grundlagen für zukünftige Informationstechnologien
12
Contributing Institute
Halbleiter-Nanoelektronik; IBN-1
JARA-FIT; JARA-FIT
12
Zentralabteilung für Chemische Analysen; ZCH
1
Scientific Report
2010
12
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