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Institut für Festkörperforschung; IFF
Ebert, P.
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Gebauer, J.
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Institut für Festkörperforschung; IFF
Ebert, P.
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Gebauer, J.
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Journal Article
Effect of dopant atoms on the roughness of III-V semiconductor cleavage surfaces
Quadbeck, W. J.
2000
Applied physics letters, 76 (2000) S. 300 - 302
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Ebert, P.
Gebauer, J.
Krause-Rehberg, R.
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Quadbeck, W. J.
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Urban, K.
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Erforschung neuer Materialien
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Institut für Festkörperforschung; IFF
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2000
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