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Mikrostrukturforschung; IFF-IMF
Kohlstedt, H.
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Mikrostrukturforschung; IFF-IMF
Kohlstedt, H.
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1
Journal Article
Surface treatment effects on the thickness dependence of the remanent polarization of PbZr0.52Ti0.48O3 capacitors
Rodriguez Contreras, J.
2003
Applied physics letters, 83 (2003) S. 126
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2
Journal Article
Introduction and characterization of interfacial defects in SrRuO3/BaTiO3/SrRuO3 multilayer films
Jia, C. L.
2003
Journal of crystal growth, 247 (2003) S. 381
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Journal Article
Resistive switching in metal-ferroelectric-metal junctions
Rodriguez-Contreras, J.
2003
Applied physics letters, 83 (2003) S. 4595
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Reproducable and bistable switching events in I-V curves of ultrathin Pb(Zr,Ti)O3 and BaTiO3 films
Kohlstedt, H.
2003
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Journal Article
3
Poster
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Kohlstedt, H.
Poppe, U.
3
Rodriguez Contreras, J.
3
Waser, R.
3
Buchal, Ch.
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Jia, C. L.
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Schubert, Jürgen
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Gerber, Andreas
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Lentzen, M.
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Pertsev, N. A.
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Pertsev, R. A.
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Rodriguez-Contreras, J.
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Szot, K.
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Research Program
Kondensierte Materie
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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Mikrostrukturforschung; IFF-IMF
Elektrokeramische Materialien; IFF-EKM
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Institut für Halbleiterschichten und Bauelemente; ISG-1
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