JuLib | Articles & more

1

Direct measurement of electrostatic potentials at the atomic scale: A conceptual comparison between electron holography and scanning transmission electron microscopy

Winkler, Florian
2020

Ultramicroscopy, 210 (2020) S. 112926

Published on 2019-12-30. Available in OpenAccess from 2021-12-30. Published on 2019-12-30. Available in OpenAccess from 2021-12-30.

2

Conference Presentation

Quantitative comparison of momentum-resolved STEM and off-axis electron holography at atomic resolution

Winkler, Florian
2019

3

Conference Presentation

Quantitative comparison of momentum-resolved STEM and off-axis electron holography at atomic resolution

Winkler, Florian
2019

4

Poster

Quantitative comparison of momentum-resolved STEM and off-axis electron holography at atomic resolution

Winkler, Florian
2019

5

Conference Presentation

From structural of functional characterisation:Measurement of atomic electric fields and polarisations by momentum-resolved STEM

Müller-Caspary, Knut
2019

6

Conference Presentation

Scanning transmission electron microscopy as a multidimensional information channel with spatial momentum and time resolution

Müller-Caspary, Knut
2019

7

Talk (non-conference)

Quantitative agreement between electron-optical phase images of WSe2 and simulations based on electrostatic potentials that include bonding effects

Verstraete, Matthieu
2018

8

Journal Article

Atomic-scale quantification of charge densities in two-dimensional materials

Müller-Caspary, Knut
2018

Physical Review B Physical review / B, 98 98 (2018 2018) 12 12, S. 121408 121408

OpenAccess OpenAccess

9

Journal Article

Absolute Scale Quantitative Off-Axis Electron Holography at Atomic Resolution

Winkler, Florian
2018

Physical review letters, 120 (2018) 15, S. 15 - 13

OpenAccess OpenAccess

10

Journal Article

Quantitative measurement of mean inner potential and specimen thickness from high-Resolution off-axis electron holograms of ultrathin layered WSe2

Winkler, Florian
2017

Ultramicroscopy, 178 (2017) S. 38 - 47

OpenAccess OpenAccess

11

Contribution to a conference proceedings

Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors

Müller - Caspary, K.
2016

12

Contribution to a book
Contribution to a conference proceedings

Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2

Winkler, Florian
2016

13

Contribution to a book
Contribution to a conference proceedings

Quantitative STEM - From composition to atomic electric fields

Rosenauer, Andreas
2016

14

Contribution to a book
Contribution to a conference proceedings

Limitations and challenges in off-axis electron holography of electromagnetic fields in nanoscale materials

Dunin-Borkowski, Rafal
2016

15

Contribution to a book
Contribution to a conference proceedings

Fabrication and characterization of a fine electron biprism on a Si-on-insulator MEMS chip

Duchamp, Martial
2016

16

Journal Article

Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors

Müller-Caspary, Knut
2016

Microscopy and microanalysis, 22 (2016) S3, S. 484 - 485

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