Applications and microanalysis.

Saved in:
Beddow, J. K., (editor)
Boca Raton,FL : CRC Pr., 1984.
246 S.
englisch
0849357845
9780849357848
CRC series on fine particle science and technology.
Uniscience series on fine particle science and technology.
Particle characterization in technology ; 1.
surface analysis of small individual particles by secondary ion mass spectroscopy (SIMS)
laser microprobe mass analysis (LAMMA) in particle analysis
the analysis of particles by electron microscopy and spectroscopy
characterization of pharmaceutical particulate materials
fractal description of fine particle systems
behavior of bulk solids
evaluation of explosion and fire properties of powders and dusts
practical aspects of electrozone size analysis
particle size instrumentation - Coulter counter
fine particle characterization methods in liquid suspension

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