Applications and microanalysis.
Saved in:
| Personal Name(s): | Beddow, J. K., editor |
|---|---|
| Imprint: |
Boca Raton,FL :
CRC Pr.,
1984.
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| Physical Description: |
246 S. |
| Note: |
englisch |
| ISBN: |
0849357845 9780849357848 |
| Series Title: |
CRC series on fine particle science and technology.
Uniscience series on fine particle science and technology. Particle characterization in technology ; 1. |
| Keywords: |
surface analysis of small individual particles by secondary ion mass spectroscopy (SIMS) laser microprobe mass analysis (LAMMA) in particle analysis the analysis of particles by electron microscopy and spectroscopy characterization of pharmaceutical particulate materials fractal description of fine particle systems behavior of bulk solids evaluation of explosion and fire properties of powders and dusts practical aspects of electrozone size analysis particle size instrumentation - Coulter counter fine particle characterization methods in liquid suspension |
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Reading Room  Call Number: CWO 024-01 Barcode: 1085003361
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