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Applications and microanalysis.

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Personal Name(s): Beddow, J. K., editor
Imprint: Boca Raton,FL : CRC Pr., 1984.
Physical Description: 246 S.
Note: englisch
ISBN: 0849357845
9780849357848
Series Title: CRC series on fine particle science and technology.
Uniscience series on fine particle science and technology.
Particle characterization in technology ; 1.
Keywords: surface analysis of small individual particles by secondary ion mass spectroscopy (SIMS)
laser microprobe mass analysis (LAMMA) in particle analysis
the analysis of particles by electron microscopy and spectroscopy
characterization of pharmaceutical particulate materials
fractal description of fine particle systems
behavior of bulk solids
evaluation of explosion and fire properties of powders and dusts
practical aspects of electrozone size analysis
particle size instrumentation - Coulter counter
fine particle characterization methods in liquid suspension
Subject (ZB):
particle size
laser microprobe spectroscopy
solids flow
microanalysis
Classification:
CWOC - Characterization and size measurement of particles
CTYR - Microanalysis
Shelf Classification:
CWO - Trennprozesse, Rekombinationsprozesse - mechanisch
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Reading Room Call Number: CWO 024-01 Barcode: 1085003361 Available   

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