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Mess- und Prüftechnik.

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Personal Name(s): Zerbst, M.
Imprint: Berlin : Springer, 1986.
Physical Description: 385 S.
Note: deutsch
ISBN: 9783540158783
3540158782
9780387158785
0387158782
Series Title: Halbleiter-Elektronik ; 20.
Keywords: integrated circuit : testing : measurement
integrated circuit : function test : reliability : scanning electron microscopy
measurement : semiconductor rectifier : optoelectronics
Classification:
TBJ - Integrated circuits
FGML - Characterization of electronic materials
Shelf Classification:
FGM - Mikroelektronik - Technologie
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IKP
Institute Call Number: B 032905'01'-020 Barcode: 1086000802 Available   

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