Mess- und Prüftechnik.
Saved in:
Personal Name(s): | Zerbst, M. |
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Imprint: |
Berlin :
Springer,
1986.
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Physical Description: |
385 S. |
Note: |
deutsch |
ISBN: |
9783540158783 3540158782 9780387158785 0387158782 |
Series Title: |
Halbleiter-Elektronik ;
20. |
Keywords: |
integrated circuit : testing : measurement integrated circuit : function test : reliability : scanning electron microscopy measurement : semiconductor rectifier : optoelectronics |
Classification: | |
Shelf Classification: |
IKP | |
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