Mess- und Prüftechnik.

Saved in:
Zerbst, M.
Berlin : Springer, 1986.
385 S.
deutsch
9783540158783
3540158782
9780387158785
0387158782
Halbleiter-Elektronik ; 20.
integrated circuit : testing : measurement
integrated circuit : function test : reliability : scanning electron microscopy
measurement : semiconductor rectifier : optoelectronics

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