Mess- und Prüftechnik.
Saved in:
| Personal Name(s): | Zerbst, M. |
|---|---|
| Imprint: |
Berlin :
Springer,
1986.
|
| Physical Description: |
385 S. |
| Note: |
deutsch |
| ISBN: |
9783540158783 3540158782 9780387158785 0387158782 |
| Series Title: |
Halbleiter-Elektronik ;
20. |
| Keywords: |
integrated circuit : testing : measurement integrated circuit : function test : reliability : scanning electron microscopy measurement : semiconductor rectifier : optoelectronics |
| Classification: | |
| Shelf Classification: |
| IKP | |
|---|---|
Institute  Call Number: B 032905'01'-020 Barcode: 1086000802
Available
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