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Elektronenmikroskopische Querschnittsabbildung von Interfaces und Heterostrukturen in Halbleitern / H. Bartsch ...

electron microscopical cross sectional imaging of semiconductor interfaces and heterostructures :

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Personal Name(s): Bartsch, H.
Imprint: Berlin : Akademie Verl., 1987
Physical Description: X, 84 S.
Note: deutsch
ISBN: 9783055002335
3055002334
Series Title: Beiträge zur Forschungstechnologie ; 15
Subject (ZB):
electron microscopy
semiconductor
interface
Classification:
FGML - Characterization of electronic materials
FFPE - Thin film electronic properties, semiconductor interfaces
FHGB - Conventional electron microscopy
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Open Stacks Call Number: S 003457-0015'01' Barcode: 1087106237 Available   

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