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Scanning electron microscopy 1982,2 : An international journal of scanning electron microscopy, related techniques, and applications / editor R. M. Albrecht

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Personal Name(s): Albrecht, Ralph M., editor
Imprint: AMF-O'Hare, IL : Scanning Electron Microscopy, 1983
Physical Description: XII, Seiten 465-896, XIII-XVI
Note: englisch
ISBN: 9780931288241
093128824X
Series Title: Scanning electron microscopy ; 1982,2
Classification:
FHJ - Scanning electron microscopy, analytical electron microscopy
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Open Stacks Call Number: S 003531-1982,2'01' Barcode: 1088101237 Available   

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