Scanning electron microscopy 1982,2 : An international journal of scanning electron microscopy, related techniques, and applications.

Saved in:
Albrecht, R. M., (editor)
AMF-O'Hare, IL : Scanning Electron Microscopy, 1983.
XII, S. 465-896, XIII-XVI.
englisch
9780931288241
093128824X
Scanning electron microscopy ; 1982,2.

ZB
Open Stacks Call Number: S 003531-1982,2'01' Barcode: 1088101237 Available