International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 : [proceedings] / editors, Kehsin Kuo and Junen Yao.
electron microscopy :
Saved in:
Personal Name(s): | Kuo, Ko-hsin. |
---|---|
Yao, Chün-en. | |
Imprint: |
Singapore, New Jersey :
World Scientific,
1991.
|
Physical Description: |
p. cm. |
Note: |
englisch |
ISBN: |
9810205317 9789810205317 |
Subject (ZB): | |
Classification: |
ZB | |
---|---|
Open Stacks Call number: B 069020'01' Barcode: 1091104263 Available |