Surface analysis methods in materials science.
Saved in:
Imprint: |
Berlin :
Springer,
1992.
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Physical Description: |
XXI, 453 S. |
Note: |
englisch |
ISBN: |
3540536116 0387536116 9780387536118 9783540536116 |
Series Title: |
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Springer series in surface sciences ;
vol 0023. |
Keywords: |
solid surfaces - their structure and composition electron microscopy techniques for surface characterization sputter depth profiling SIMS - secondary ion mass spectrometry Auger spectroscopy and scanning Auger microscopy X-ray photoelectron spectroscopy (XPS) Fourier transform infrared spectroscopy (FTIR) of surfaces Rutherford backscattering spectrometry (RBS) and nuclear reaction analysis (NRA) scanning tunneling microscopy (STM) low energy ion scattering (LEIS) reflection high energy electron diffraction (RHEED) low energy electron diffraction (LEED) ultraviolet photoelectron spectroscopy (UPS) of solids spin polarized electron techniques surface characterization in materials technology characterization of catalysts by surface analysis applications to devices and device materials characterization of oxidized surfaces coated steels thin film analysis identification of adsorbed species |
Subject (ZB): | |
Classification: |
IBN-3-4 | |
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Institute Call number: S 005819-0023'01' Barcode: 1092101768 Available |