International tables for crystallography. C. Mathematical, physical and chemical tables.

Personal Name(s):	Wilson, A. J., editor
Imprint:	Dordrecht : Kluwer Academic Publ., 1992.
Physical Description:	XXIX, 883 S.
Note:	englisch
ISBN:	9780792316381 079231638X
Series Title:	International tables for crystallography ; C.
Keywords:	Crystal geometry and symmetry summary of general formulae application to the crystal systems twinning arithmetic crystal classes Diffraction geometry and its practical realization (experimental techniques) classification of experimental techniques single crystal x-ray techniques powder and related techniques: x-ray techniques powder and related techniques: electron and neutron techniques energy dispersive techniques small angle techniques: x-ray and neutron techniques topography Preparation and examination of crystal specimens investigation and selection of crystals determination of the mass density of solids measurement of refractive index mounting and setting of specimens for x-ray crystallographic studies preparation of specimens for electron diffraction and electron microscopy specimens for neutron diffraction Production and properties of radiations radiations used in crystallography x-rays (generation, wavelengths, absorption spectra, absorptioon coefficients, dispersion corrections) electron diffraction (scattering factors, electron energy loss spectroscopy, HREM) neutron techniques (neutron beam devices, scattering lengths, magnetic form factors, absorption coefficients) Determination of crystal lattice parameters x-ray diffraction methods: polycrystalline x-ray diffraction methods: single crystal electron diffraction methods neutron methods Interpretation of diffracted intensities intensity of diffracted intensities (x-ray scattering, magnetic neutron scattering, nuclear scattering of neutrons) trigonometric intensity factors x-ray absorption (absorption coefficients, dispersion, absorption corrections) the flow of radiation in a real crystal Measurement of intensities detectors for x-rays detectros for electrons thermal neutron detection correction of systematic errors (absorption, thermal diffuse scattering, Compton scattering, white radiation) statistical fluctuations Refinement of structural parameters least squares other refinement methods constraints and restraints in refinement statistical significance tests detection and treatment of systematic error the Rietveld method analysis of charge and spin densities accurate structure factor determination with electron diffraction Basic structural features sphere packings and packings of ellipsoids layer stacking in close packed and polytypic structures typical interatomic distances: metals typical interatomic distances: inorganic compounds typical interatomic distances: organometallic compounds and coordination complexes of the d- and f- band metals the space group distribution of molecular organic structures incommensurate and commensurate modulated structures Precautions against radiation injury introduction (general aspects, responsibilities) protection from ionizing radiation responsible authorities
Subject (ZB):	crystallography crystal symmetry diffraction
Classification:	FCDE - Symmetry in condensed matter FHC - Diffraction methods in materials characterization FAAA - Crystallography - reference books FCA - Crystallography