International tables for crystallography. C. Mathematical, physical and chemical tables.

Saved in:
Wilson, A. J., (editor)
Dordrecht : Kluwer Academic Publ., 1992.
XXIX, 883 S.
englisch
9780792316381
079231638X
International tables for crystallography ; C.
Crystal geometry and symmetry
summary of general formulae
application to the crystal systems
twinning
arithmetic crystal classes
Diffraction geometry and its practical realization (experimental techniques)
classification of experimental techniques
single crystal x-ray techniques
powder and related techniques: x-ray techniques
powder and related techniques: electron and neutron techniques
energy dispersive techniques
small angle techniques: x-ray and neutron techniques
topography
Preparation and examination of crystal specimens
investigation and selection of crystals
determination of the mass density of solids
measurement of refractive index
mounting and setting of specimens for x-ray crystallographic studies
preparation of specimens for electron diffraction and electron microscopy
specimens for neutron diffraction
Production and properties of radiations
radiations used in crystallography
x-rays (generation, wavelengths, absorption spectra, absorptioon coefficients, dispersion corrections)
electron diffraction (scattering factors, electron energy loss spectroscopy, HREM)
neutron techniques (neutron beam devices, scattering lengths, magnetic form factors, absorption coefficients)
Determination of crystal lattice parameters
x-ray diffraction methods: polycrystalline
x-ray diffraction methods: single crystal
electron diffraction methods
neutron methods
Interpretation of diffracted intensities
intensity of diffracted intensities (x-ray scattering, magnetic neutron scattering, nuclear scattering of neutrons)
trigonometric intensity factors
x-ray absorption (absorption coefficients, dispersion, absorption corrections)
the flow of radiation in a real crystal
Measurement of intensities
detectors for x-rays
detectros for electrons
thermal neutron detection
correction of systematic errors (absorption, thermal diffuse scattering, Compton scattering, white radiation)
statistical fluctuations
Refinement of structural parameters
least squares
other refinement methods
constraints and restraints in refinement
statistical significance tests
detection and treatment of systematic error
the Rietveld method
analysis of charge and spin densities
accurate structure factor determination with electron diffraction
Basic structural features
sphere packings and packings of ellipsoids
layer stacking in close packed and polytypic structures
typical interatomic distances: metals
typical interatomic distances: inorganic compounds
typical interatomic distances: organometallic compounds and coordination complexes of the d- and f- band metals
the space group distribution of molecular organic structures
incommensurate and commensurate modulated structures
Precautions against radiation injury
introduction (general aspects, responsibilities)
protection from ionizing radiation
responsible authorities

ZB
Open Stacks Call Number: B 056228'01'-C Barcode: 1092102752 Available   
IBI-6
Institute Call Number: B 056228'01'-C Barcode: 1095100783 Available