Scanning force microscopy: with applications to electric, magnetic and atomic forces.
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| Personal Name(s): | Sarid, D. |
|---|---|
| Edition: |
Rev. ed. |
| Imprint: |
New-York, NY :
Oxford University Pr.,
1994.
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| Physical Description: |
XIII, 263 S. |
| Note: |
englisch |
| ISBN: |
9780195092042 019509204X |
| Series Title: |
Oxford series in optical and imaging sciences ;
5. |
| Keywords: |
Mechanics in scanning force microscopy: levers and noise mechanical properties of levers resonance enhancement sources of noise Scanning force microscopes: instrumentation tunneling detection system capacitance detection system homodyne detection system heterodyne detection system laser- diode feedback detection systems polarizartion detection system deflection detection system Scanning force microscopy: physics and applications electric force microscopy magnetic force microscopy atomic force microscopy |
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Reading Room  Call Number: FHE 058 Barcode: 1095100268
Available
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