Advances in imaging and electron physics. 93 / Peter W. Hawkes Hrsg.

Personal Name(s):	Hawkes, Peter W., editor
Imprint:	San-Diego, CA : Academic Pr., 1995
Physical Description:	XII, 338 S.
Note:	englisch
ISBN:	0120147351 9780120147359
Series Title:	Advances in imaging and electron physics ; 93
Subject (ZB):	imaging technique Fourier transform STEM [scanning transmission electron microscopy) lens orientation image analysis
Classification:	FHE - Imaging methods in materials characterization
Shelf Classification:	FHE - Bildgebende Verfahren in der Materialcharakterisierung