Principles of analytical electron microscopy / ed. by David C. Joy ...
electron beam\specimen interaction in the analytical electron microscope
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Personal Name(s): | Joy, David C., editor |
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Imprint: |
New York :
Plenum Press,
1986.
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Physical Description: |
xvi, 448 p. |
Note: |
englisch |
ISBN: |
0306423871 9780306423871 |
Classification: | |
Shelf Classification: |
ZB | |
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Reading Room Call number: FHJ 010 Barcode: 1087105514 Available |