International Electron Devices Meeting. 1997 : Washington, DC, December 7-10, 1997 : EDM technical digest.
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Imprint: |
Piscataway, NJ :
IEEE,
1997.
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Physical Description: |
Getr. Pag. |
Note: |
englisch |
ISBN: |
0780341023(microfiche) 0780341007(pbk.) 0780341031(CDROM) 0780341015(hbd.) |
Series Title: |
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International Electron Devices Meeting ;
1997. |
Keywords: |
CMOS devices and reliability device interconnect technology detectors, sensors, displays integrated circuits, solid state devices quantum electronics, compound semiconductors modeling and simulation |
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ZB | |
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Reading Room Call number: FGM 111-97 Barcode: 1200102878 Available |