Methods of surface analysis / edited by J.M. Walls.
Saved in:
Personal Name(s): | Walls, J. M. |
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Imprint: |
Cambridge [Cambridgeshire], New York :
Cambridge University Press,
1989.
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Physical Description: |
x, 342 p. |
Note: |
englisch |
ISBN: |
0521305640 9780521305648 |
Keywords: |
methods of surface analysis ion erosion in surface analysis electron and ion energy energy surface analysis Auger electron spectroscopy (AES) x-ray photoelectron spectroscopy (XPS) static secondary ion mass spectroscopy (SIMS) dynamic secondary ion mass spectroscopy (SIMS) ion scattering spectroscopy (ISS) Rutherford backscattering spectroscopy (RBS) |
Classification: | |
Shelf Classification: |
ZB | |
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Reading Room Call number: FHA 023 Barcode: 1089100199 Available |