Growth and characterisation of semiconductors : papers contributing to a short course / organised by the Departments of Materials and Physics with the Continuing Education Centre at Imperial College, in association with the London University Interdisciplinary Research Centre for Semiconductor Materials ; edited by R.A. Stradling and P. Klipstein.
Saved in:
Personal Name(s): | Stradling, R. A. |
---|---|
Klipstein, P. | |
Imprint: |
Bristol [England], New York :
Hilger,
1990.
|
Physical Description: |
xii, 239 p. |
Note: |
englisch |
ISBN: |
0852741316 9780852741313 |
Keywords: |
the basics of epitaxy metal organic chemical vapor deposition (MOCVD) for the preparation of semiconductor materials and devices growth of thin films and heterostructures of III-V compounds by molecular beam epitaxy (MBE) scanning electron microscopy (SEM) microcharacterization of semiconductor materials and devices depth profiling of semiconductor materials by secondary ion mass spectrometry (SIMS) localized vibrational mode spectroscopy of impurities in semiconductor crystals point defects studies using electron spin resonance (ESR) photoluminescence characterization of semiconductor materials Hall, magnetoresistance and infrared conductivity measurements in semiconductors characterization of semiconductors by capacitance methods high resolution electron microscopy (HREM) of semiconductors |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
ZB | |
---|---|
Reading Room Call number: FGM 182 Barcode: 1090106126 Available |