Semiconductor interfaces, microstructures and devices : properties and applications / edited by Zhe Chuan Feng.
properties and applications of semiconductor interfaces, microstructures and devices :
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Personal Name(s): | Feng, Zhe Chuan. |
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Imprint: |
Bristol, Philadelphia :
Institute of Physics Pub.,
1993.
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Physical Description: |
xiv, 293 p. |
Note: |
englisch |
ISBN: |
9780750301800 0750301805 |
Keywords: |
electric field induced localization in superlattices intersubband transitions and quantum well infrared photodetectors real- time spectroscopic ellipsometry monitoring of semiconductor growth and etching X-ray reflecticity from heteroepitaxial layers spontaneous and stimulated emissions from optical microcavity structures radiative and nonradiative recombination in AlGaAs and InGaAsP heterostructures and some features of the corresponding quantum well laser diodes far infrared cyclotron resonance of a two- dimensional electron gas in III-V semiconductor heterostructures optics in lower- dimensional quantum confined II-VI heterostructures growth and doping of silicon by low temperature molecular beam epitaxy point defects and charge traps in the Si\SiO2 system and related structures growth and characterization of silicon carbide polytypes for electronic applications |
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ZB | |
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Reading Room Call number: FFP 069 Barcode: 1093103914 Available |