Investigation of nanoscale potential fluctuations and defects in 2D semiconducting structures by Scanning Tunneling Microscopy [E-Book] / Sebastian Landrock
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JuSER Table of Contents Full text |
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Personal Name(s): | Landrock, Sebastian, author |
Imprint: |
Jülich :
Forschungszentrum, Zentralbibliothek,
2009
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Physical Description: |
1 Online-Ressource (145 Seiten) |
Note: |
englisch |
Series Title: |
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Berichte des Forschungszentrums Jülich ;
4290 |
Dissertation Note: |
Zugleich: Dissertation, Rheinisch-Westfälische Technische Hochschule Aachen, 2009
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Subject (ZB): | |
Classification: |
Description not available. |