Markov random field modeling in image analysis / Stan Z. Li

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Li, Stan Z.
3rd ed.
London : Springer, 2009
XXII, 357 S.
englisch
9781848002784
9781848002791 (e-ISBN)
Advances in pattern recognition
Table of Contents

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Reading Room Call Number: DYG 013'03' Barcode: 1209101051 Available