Hutchison, D., Kleinberg, J. M., Mattern, F., Nierstrasz, O., Nixon, M. S., Steffen, B., . . . Tygar, D. (2009). Advances in Biometrics: [E-Book] : Third International Conference, ICB 2009, Alghero, Italy, June 2-5, 2009. Proceedings / edited by David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Massimo Tistarelli, Mark S. Nixon. Berlin, Heidelberg: Springer Berlin Heidelberg.
Chicago Style CitationHutchison, David, et al. Advances in Biometrics: [E-Book] : Third International Conference, ICB 2009, Alghero, Italy, June 2-5, 2009. Proceedings / Edited By David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Massimo Tistarelli, Mark S. Nixon. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009.
MLA CitationHutchison, David, et al. Advances in Biometrics: [E-Book] : Third International Conference, ICB 2009, Alghero, Italy, June 2-5, 2009. Proceedings / Edited By David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Massimo Tistarelli, Mark S. Nixon. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009.