Measurement methods for the semiconductor device industry - a summary of NBS activity.
Saved in:
Personal Name(s): | Bullis, W. Murray. |
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Imprint: |
Washington :
for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1969.
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Physical Description: |
ii, 22 S. |
Note: |
englisch |
Series Title: |
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NBS technical note ;
511. |
Keywords: |
radiation detectors,semiconductor(germanium) : lithium-drifted silicon crystals : electric conductivity germanium crystals : electric conductivity silicon junctions : breachage |
Classification: |
ZB | |
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Open Stacks Call number: S 000552-0511'01' Barcode: 1070006267 Available |