Epitaktisches Wachstum und strukturelle, elektrische und optische Charakterisierung von Ru2Si3-Schichten [E-Book] / Daniel Lenssen
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Personal Name(s): | Lenssen, Daniel, author |
Imprint: |
Jülich :
Forschungszentrum, Zentralbibliothek,
2000
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Physical Description: |
1 Online-Ressource (IV, 114 Seiten) |
Note: |
deutsch |
Series Title: |
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Berichte des Forschungszentrums Jülich ;
3783 |
Dissertation Note: |
Zugleich: Dissertation, Rheinisch-Westfälische Technische Hochschule Aachen, 2000
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Keywords: |
epitaxial growth and the structural, electrical and optical characterization of Ru2Si3 - thin films |
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Classification: |
Description not available. |