Methods of surface analysis / edited by A. W. Czanderna
Saved in:
Personal Name(s): | Czanderna, Alvin Warren, editor |
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Imprint: |
Amsterdam :
Elsevier Scientific Pub.,
1975
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Physical Description: |
481 S. |
Note: |
englisch |
ISBN: |
0444413448 9780444413444 |
Series Title: |
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Methods and phenomena, their applications in science and technology ;
1 |
Keywords: |
surface analysis : textbook : classification sputtering : surface analysis,review review : ion scattering spectroscopy : photoelectron spectroscopy : Auger electron spectroscopy : secondary ion emission : sims microelectronics : sims : Auger electron spectroscopy review : ion microscopy : fims : infrared reflection absorption spectroscopy |
Classification: |
ZB | |
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Open Stacks Call number: S 003201-0001'01' Barcode: 1079000917 Available |