Abbildung von Oberflächen mit Elektronen, Ionen und Röntgenstrahlen ..
Saved in:
Personal Name(s): | Seiler, Helmut. |
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Imprint: |
Mannheim, Zürich :
Bibliographisches Institut,
1968.
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Physical Description: |
132 S. |
Note: |
deutsch |
Series Title: |
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BI-Hochschultaschenbücher ;
428/428a. |
Keywords: |
surface analysis : measuring method surface analysis : electron microscopy : ion microscopy |
Classification: |
ZB | |
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Open Stacks Call number: S 000570-0428\0428A'01' Barcode: 1068005139 Available |