Elektronische Struktur von Silizium-karbid-Polytypen untersucht mit Weichröntgenspektroskopie [E-Book] / Christoph Ellmers
electronic structure of silicon carbide ( 3c- sic, 4h- sic, 6h- sic) determined by soft x-ray spectroscopy
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Full text JuSER |
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Personal Name(s): | Ellmers, Christoph, author |
Imprint: |
Jülich :
Forschungszentrum, Zentralbibliothek,
1996
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Physical Description: |
1 Online-Ressource (75 Seiten) |
Note: |
deutsch |
Series Title: |
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Berichte des Forschungszentrums Jülich ;
3204 |
Dissertation Note: |
Zugleich: Diplomarbeit, Universität Köln
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Subject (ZB): | |
Classification: |
electronic structure of silicon carbide ( 3c- sic, 4h- sic, 6h- sic) determined by soft x-ray spectroscopy |