Applications of advanced surface spectroscopic techniques : Solid vacuum interface conference 6 : Delft, 07.05.80-09.05.80.
Saved in:
Imprint: |
Amsterdam :
North Holland,
1980.
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Physical Description: |
S. 189-346. |
Note: |
englisch |
Series Title: |
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Applications of surface science ;
6, 3/4. |
Keywords: |
conference netherlands : surface physics : surface analysis xps : application review : electron energy loss spectroscopy : exafs |
Classification: |