Surface science techniques / ed. by J. M. Walls ...
Surface science techniques:
Saved in:
Personal Name(s): | Walls, J. M., editor |
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Imprint: |
Amsterdam :
Elsevier,
1994.
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Physical Description: |
VIII, 188 S. |
Note: |
Repr. from: Vacuum 45, 6/7 englisch |
ISBN: |
9780080421483 0080421482 |
Keywords: |
surface science techniques: overview x-ray photoelectron spectroscopy (XPS) Auger electron spectroscopy (AES) x-ray absorption fine structure for surface studies (XAFS) surface infrared spectroscopy (FTIR, DRIFTS, RAIRS) angle- resolved UV photoelectron spectroscopy (ARUPS) ballistic computer simulation in surface science secondary ion mass spectrometry (SIMS) ion scattering spectroscopy (ISS) Rutherford backscattering (RBS) and nuclear reaction analysis (NRA) scanning tunneling microscopy (STM) atom probe field ion microscopy (APFIM) |
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Reading Room Call number: FHA 026 Barcode: 1095100435 Available |